Scanning Probe Microscopy of Functional Materials Nanoscale Imaging
Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overvie
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Sergei V. Kalinin • Alexei Gruverman Editors
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Editors Sergei V. Kalinin The Center for Nanophase Materials Sciences and Technology Division Oak Ridge National Laboratory 1 Bethel Valley Road 37831 Oak Ridge Tennessee USA [email protected]
Alexei Gruverman University of Nebraska - Lincoln Department of Materials Science and Engineering Department of Physics & Astronomy 202 Ferguson Hall 7920 68588 Lincoln Nebraska USA [email protected]
ISBN 978-1-4419-6567-7 e-ISBN 978-1-4419-7167-8 DOI 10.1007/978-1-4419-7167-8 Springer New York Dordrecht Heidelberg London Library of Congress Control Number: 2010938721 © Springer Science+Business Media, LLC 2010 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper Springer is part of Springer Science+Business Media (www.springer.com)
Preface
Scanning probe microscopy (SPM) has become a mainstream technique of nanoscience and nanotechnology by providing easy to use methodology for noninvasive imaging and manipulation on the nanometer and atomic scales. Beyond topographic imaging, SPM techniques have found an extremely broad range of applications in probing electrical, magnetic, optical and mechanical properties – often at the level of several tens of nanometers [1, 2], opening the way to an understanding material functionality and interactions at their fundamental length scales [3]. For more than a decade after the introduction of the first commercial microscopes in late 1980s, SPM evolved as a primarily qualitative imaging method. The surface topographic and functional (e.g., magnetic, electrostatic, or mechanical) images were acquired in parallel and were interpreted by an observer. A common feature for these measurements was that only a single or a small number of parameters describing the local properties were obtained; furthermore, information contained in complementary images was usually ignored (or interpreted solely within the limits of a cursory examination). These limitations stemmed primarily from the inherent limits of data processing electronics available at the time, the dearth of well-characterized probes, relative novelty of the field, and only a small number of available microscopic platforms. Nevertheless, even qualitative imaging capabilities have provided multipl
