Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies
In the deep sub-micron regime, the power consumption has become one of the most important issues for competitive design of digital circuits. Due to dramatically increasing leakage currents, the power consumption does not take advantage of technology scali
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advanced microelectronics
25
Springer Series in
advanced microelectronics Series Editors: K. Itoh
T. Lee T. Sakurai W.M.C. Sansen
D. Schmitt-Landsiedel
The Springer Series in Advanced Microelectronics provides systematic information on all the topics relevant for the design, processing, and manufacturing of microelectronic devices. The books, each prepared by leading researchers or engineers in their f ields, cover the basic and advanced aspects of topics such as wafer processing, materials, device design, device technologies, circuit design, VLSI implementation, and subsystem technology. The series forms a bridge between physics and engineering and the volumes will appeal to practicing engineers as well as research scientists. 18 Microcontrollers in Practice By I. Susnea and M. Mitescu 19 Gettering Defects in Semiconductors By V.A. Perevoschikov and V.D. Skoupov 20 Low Power VCO Design in CMOS By M. Tiebout 21 Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementations By M. Ortmanns and F. Gerfers 22 Detection and Signal Processing Technical Realization By W.J. Witteman 23 Highly Sensitive Optical Receivers By K. Schneider and H.K. Zimmermann 24 Bonding in Microsystem Technology By J.A. Dziuban 25 Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies By S. Henzler 26 High-Dynamic-Range (HDR) Vision Microelectronics, Image Processing, Computer Graphics Editor: B. Hoefflinger
Volumes 1–17 are listed at the end of the book.
S. Henzler
Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies With 127 Figures
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Dipl.-Ing. Stephan Henzler Institute for Technical Electronics, Technical University Munich Theresienstr. 90, 80290 Munich, Germany E-Mail: [email protected]
Series Editors:
Dr. Kiyoo Itoh Hitachi Ltd., Central Research Laboratory, 1-280 Higashi-Koigakubo Kokubunji-shi, Tokyo 185-8601, Japan
Professor Thomas Lee Stanford University, Department of Electrical Engineering, 420 Via Palou Mall, CIS-205 Stanford, CA 94305-4070, USA
Professor Takayasu Sakurai Center for Collaborative Research, University of Tokyo, 7-22-1 Roppongi Minato-ku, Tokyo 106-8558, Japan
Professor Willy M. C. Sansen Katholieke Universiteit Leuven, ESAT-MICAS, Kasteelpark Arenberg 10 3001 Leuven, Belgium
Professor Doris Schmitt-Landsiedel Technische Universit¨at M¨unchen, Lehrstuhl f¨ur Technische Elektronik Theresienstrasse 90, Geb¨aude N3, 80290 München, Germany
ISSN 1437-0387 () ISBN-10 1-4020-5080-1 (HB) ISBN-13 978-1-4020-5080-0 (HB) ISBN-10 1-4020-5081-X (ebook) ISBN-13 978-1-4020-5081-7 (ebook) Library of Congress Control Number: 2006934583 This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specif ically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microf ilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright L
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