Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and
In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging
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Electron Nanoimaging Basics of Imaging and Diffraction for TEM and STEM
Electron Nano-imaging
Nobuo Tanaka
Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM
123
Nobuo Tanaka Nagoya University Nagoya Japan
ISBN 978-4-431-56500-0 DOI 10.1007/978-4-431-56502-4
ISBN 978-4-431-56502-4
(eBook)
Library of Congress Control Number: 2016963326 © Springer Japan KK 2017 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. Printed on acid-free paper This Springer imprint is published by Springer Nature The registered company is Springer Japan KK The registered company address is: Chiyoda First Bldg. East, 3-8-1 Nishi-Kanda, Chiyoda-ku, Tokyo 101-0065, Japan
To Profs. R. Uyeda, N. Kato and J.M. Cowley
Preface
There is no doubt that imaging of nanometer-scaled materials (nano-imaging) is one of the important research areas in science and technology including bioscience. Among various kinds of experimental techniques, electron microscopy is positioned as one of the most effective methods for analyses of atomic structures, compositions, and physical and chemical properties. The present volume is a textbook on nano-imaging by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) for graduate students and early career researchers. Although there are already many textbooks for TEM, the significance of the present publication is in describing the principle of nano-imaging and its application. For this purpose, I have limited my explanation of details of electron diffraction patterns and diffraction contrast of images, and let readers refer to appendices and other references. Instead of such details, I have made efforts to describe the physical meaning of imaging using electrons on the basis of Fourier transform, particularly electrons as waves. This book starts with the physical nature of waves and extends to its a
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