Size, stability and chemistry of nanomaterials and their precursors by mass spectrometry techniques
- PDF / 1,468,443 Bytes
- 6 Pages / 612 x 792 pts (letter) Page_size
- 88 Downloads / 156 Views
1184-HH06-05
Size, stability and chemistry of nanomaterials and their precursors by mass spectrometry techniques Jean-Jacques Gaumet1, Didier Arl1,2, Stéphane Dalmasso2, Frédéric Aubriet1 and Jean-Pierre Laurenti2 1
LSMCL, Institut Jean Barriol, Université Paul Verlaine – Metz, ICPM, 1 bd Arago, 57070 Metz - France 2 LPMD, Institut Jean Barriol, Université Paul Verlaine – Metz, ICPM, 1 bd Arago, 57070 Metz - France ABSTRACT Soft ionization mass spectrometry (MS) methods [Electro-Spray Ionisation - Fourier Transform Ion Cyclotronic Resonance MS (ESI-FTICRMS) and Matrix Assisted Laser Desorption Ionization coupled with Time of Flight MS (MALDI-TOFMS)] and associated fragmentation techniques appear to be an alternative way providing data on the size, stability and exact chemical composition of nanoparticles and their precursors, and potentially on interactions between particles. We report the application of both mass spectrometry techniques to analyze IIVI semiconductor nanomaterials (CdX with X = S or Se) and their organometallic precursors. INTRODUCTION Due to their size-dependent nature, nanomaterials characterization is a crucial issue as the size, shape, and dispersity must be accurately known for applications in device technology. For example, the modification of the absorption properties in respect of the size of II/VI nanoparticles is well known [1-2]. In particular, the maximum of absorption in UV-visible wavelength range shifts to UV when the radius of CdSe particles decreases; the color consequently varies from red to yellow [3]. To control the quality of the II-VI nanoparticles – also named nanocrystals (NCs) – their synthesis properties have to be improved to yield high quality NCs. Typically, size and size dispersity in these materials are measured by TEM imaging or estimated from the optical properties. Other physical and physico-chemical methods, such as NMR, X-ray diffraction, photoelectron spectroscopy and Raman spectroscopies are excellent tools for average analysis of a cluster or a NC [4-5]. However, specific distributions in the composition and structure of individual nanomaterials are not addressed. It is also crucial to get information from the precursors of these NCs, as it may help to explain the growing mechanism of nanomaterials. The use of mass spectrometry (MS) is an alternative way for getting some information about composition, size; surface, and stability when analyzing nanoparticles that are often generated by activation of organometallic precursors [6-8]. In this context we present the potential of soft ionization mass spectrometry techniques as tools for exploring II-VI nanomaterials and their precursors. We studied a full range of precursors and nanomaterials containing cadmium atoms surrounded either by sulphur or selenium atomic species. Electrospray ionization-Fourier transform ion cyclotron resonance mass spectrometry (ESIFTICRMS) was used to analyze metal thiophenolate complexes used as precursors of semiconductors NCs. Additional structural and stability information have als
Data Loading...
