Study of magnetic metal periodic structures by X-Ray and electron microscopy methods
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Study of Magnetic Metal Periodic Structures by X-Ray and Electron Microscopy Methods G. V. Prutskova,b,*, Yu. M. Chesnokova, A. L. Vasillieva, I. A. Likhacheva, E. M. Pashaeva, and I. A. Subbotina a National
b National
Research Centre NRC “Kurchatov Institute,” Moscow, Russia Research University “Higher School of Economics,” Moscow, Russia *e-mail: [email protected] Received June 14, 2017
Abstract―Complex studies of magnetic periodic metallic systems based on Dy/Gd layers have been carried out by X-ray diffraction, resonance X-ray reflectometry, transmission electronic microscopy, and energydispersve microanalysis. The application of these methods and joint analysis of their results provide an effective approach to study of the structure and determination of the parameters of individual layers and interfaces and their structural quality with a high degree of reliability. DOI: 10.1134/S1063774517060190
INTRODUCTION Constantly increasing requirements to micro- and nanoelectronic devices dictate the necessity of searching for new materials and compounds with unique electrophysical properties. Periodic Dy/Gd structures, which are characterized by a helicoidally ordered magnetic structure at low temperatures, obviously belong to these materials [1]. Promising components on their basis can be applied as memory elements using the magnetic moment rotation direction (chirality) [2] to record information. Hence, devices of this type can be assigned to the elemental base of spintronics. The state of boundaries between the Dy/Gd layers forming a superlattice with a large period, which directly affects the ordering of magnetic moments in the structure and, therefore, the potential characteris-
×20
A
B
Cr, 100 Å
Cr, 100 Å
Gd, 100 Å Dy, 150 Å
×20
Gd, 60 Å Dy, 30 Å
Y, 500 Å
Y, 500 Å
Nb, 1000 Å
Nb, 1000 Å
Al2O3 (1120) Substrate
Al2O3 (1120) Substrate
Fig. 1. Schematic diagram of the samples.
tics of the devices based on them is of the greatest interest. A comprehensive study of such systems makes it possible to find a relationship between the structural parameters and electrophysical properties, and a joint application of X-ray diffraction and electron microscopy increases the accuracy and reliability of results obtained on different scales. EXPERIMENTAL The samples under study were periodic structures of alternating layers grown on a sapphire substrate with the (1120 ) orientation and Y and Nb buffer layers. The sample surface was coated by a thin protective Cr layer. The growth was carried out using high-vacuum magnetron sputtering. Samples A and B differed by the growth regimes and thicknesses of Dy/Gd layers (Fig. 1). X-ray diffraction and reflectometry experiments were carried out on a laboratory Rigaku Smart Lab diffractometer with a rotating copper anode in the θ– 2θ scan mode (see [3] for more details). Resonant X-ray reflectometry was carried out near the Gd L3 absorption edge to obtain the best optical contrast between Dy and Gd. The experiments were performed on the X-ray Cryst
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