Continuous Amorphous Silicon Depositions Over Large and Very Large (> IM 2 ) Areas

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CONTINUOUS AMORPHOUS SILICON DEPOSITIONS OVER LARGE 2 AND VERY LARGE (> im ) AREAS A. MADAN, S. KUHL AND B. VON ROEDERN 12441 West 49th Avenue, Glasstech Solar, Inc., (GSI), 80033, U.S.A.

Colorado

Wheatridge,

ABSTRACT We present data of materials and devices produced from GSI's continuous mass

production

system for

development

recent

large

area

solar

cells.

We

system which is

of a multichamber

also

discuss our

capable

of producing

2

uniform a-Si:H layers over areas of 2 m .

Introduction It

is

well known that the growth mechanisms of a-Si:H films depends on

a multitude

of interlinked effects related to deposition;

that any PECVD system for thin film depositions versatility

in

aspects

an

of

reactors 6'

(120

1987,

its basic design. integrated

In

system

it

is

then clear

should incorporate

maximum

the following we shall describe

design

from

ultra-high

vacuum

some

research

to very large systems capable of depositing a-Si:H layers on 4' cms X 180 cms)

Madan et al.,

size substrates

(Madan,

1987,

X

von Roedern and Madan,

1987).

GSI's Ultra High Vacuum Multichamber Research Systems It

is

known

direct,

if

of

a-Si:H

the

substrate, plasma,

(c)

(f)

substrate,

the

material; flow

following (a)

rate,

excitation (i)

There devices

that

deposition

parameters

distance,

(b)

temperature

of

pressure,

(e)

confinement

of

discharge power,

(h)

frequency,

(g)

are

other solar

factors cells)

which

are

of

electrons

and

also

to be

holes

increasing decreases

the

have

rapidly

to

a

low

value

where

Numerous

studies have

the i-layers decreases

A is

level of

a bearing when multilayers

fabricated.

B or P in

oxygen contamination

voltage bias of

etc.

recombination lifetime of the free carriers.

the

mobility

and

r

the Ar is

the

There are many reports that by (0.3%)

5.10-10

the

cm2/V

pr product of holes (Delahoy

& Griffith,

These considerations then naturally imply that the deposition system

should incorporate certainly

for

ultra-high vacuum

device

work,

the

( : 10-9 torr)

system

should

pumping capability

have

multi-chambers.

example of such a multichamber with a load lock system is and

a

deposition

pre deposition pressure,

(e.g.

products

GSI

have

anode-cathode (d)

shown that even 1 ppm of residual

1981).

system

not totally understood, bearing on the opto-electronic properties

is

now being

used by many

Mat. Res. Soc. Symp. Proc. Vol. 118. '1988 Materials Research Society

prestigious

and An

manufactured by

laboratories

around

the

588

world.

In no

hence

valves.

gate

achieving

With

(a)

in

pressure through

contamination

can

baking,

these

range.

The

discussed

(h)

systems

systems above

2

100 cm

high quality

substrate

area.

opto-electronic

are

are

the

give

to

of

capable

provided the

with

maximum shield

A plasma confinement

incorporated which promotes excellent uniformity

± 5% over

via

arise

separated via the load lock as well as

is

materials and device r