Lock-in Thermography Basics and Use for Evaluating Electronic Device
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulat
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Otwin Breitenstein · Wilhelm Warta Martin C. Schubert
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials Third Edition
Springer Series in Advanced Microelectronics Volume 10
Series editors Kukjin Chun, Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea (Republic of) Kiyoo Itoh, Hitachi (Japan), Tokyo, Japan Thomas H. Lee, Department of Electrical Engineering, Stanford University, Stanford, CA, USA Rino Micheloni, Torre Sequoia, II piano, PMC-Sierra, Vimercate (MB), Italy Takayasu Sakurai, The University of Tokyo, Tokyo, Japan Willy M. C. Sansen, ESAT-MICAS, Katholieke Universiteit Leuven, Leuven, Belgium Doris Schmitt-Landsiedel, Lehrstuhl fur Technische Elektronik, Technische Universität München, München, Germany
The Springer Series in Advanced Microelectronics provides systematic information on all the topics relevant for the design, processing, and manufacturing of microelectronic devices. The books, each prepared by leading researchers or engineers in their fields, cover the basic and advanced aspects of topics such as wafer processing, materials, device design, device technologies, circuit design, VLSI implementation, and subsystem technology. The series forms a bridge between physics and engineering and the volumes will appeal to practicing engineers as well as research scientists.
More information about this series at http://www.springer.com/series/4076
Otwin Breitenstein Wilhelm Warta Martin C. Schubert •
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials Third Edition
With 123 Figures
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Otwin Breitenstein Max Planck Institute of Microstructure Physics Halle, Germany
Martin C. Schubert Fraunhofer Institute for Solar Energy Systems Freiburg, Germany
Wilhelm Warta Fraunhofer Institute for Solar Energy Systems Freiburg, Germany
ISSN 1437-0387 ISSN 2197-6643 (electronic) Springer Series in Advanced Microelectronics ISBN 978-3-319-99824-4 ISBN 978-3-319-99825-1 (eBook) https://doi.org/10.1007/978-3-319-99825-1 Library of Congress Control Number: 2018952623 1st and 2nd edition: © Springer-Verlag Berlin Heidelberg 2003, 2010 3rd edition: © Springer Nature Switzerland AG 2018 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and informat
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