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Product News
Ó ASM International 2011
Thermography-Based System Analyzes Frequency Converter Modules Electronic modules are subject to diverse loads during operation that can lead to power losses. These loads frequently cause the temperature of the components and their surroundings to rise, and this can be made visible by thermography. The Industry Solutions Division of Siemens AG has developed a system for analyzing frequency converter modules using recorded thermal images to investigate both defects and functioning parts. These images are compared with corresponding images in a reference database, and if sources of faults are identified, the test system automatically outputs recommendations for repairs and spare parts. This reduces the time required to diagnose and repair frequency converter modules by up to 30%, in turn reducing the expenditure on repairs and spare parts
and also enabling realistic estimates to be made of the remaining service life and risk of the module failing. This method requires only a few minutes to check electronic modules for thermal risks, damage, and critical areas. The analysis quickly provides reliable information about the current operating condition, long before damage would otherwise become visible. The Siemens automatic module analysis system also uses this methodology. It involves dismounting the control unit and subjecting it to an electrical functional test. The temperature distribution over the surface is then determined by measuring the infrared radiation. For more information: Mrs. Rebecca Zapfe, Industry Solutions Division, Siemens AG, Schuhstr. 60, 91052 Erlangen, Germany; tel: +49 (9131) 7-46076; e-mail: [email protected]; web: www.siemens.com/ industry-solutions.
Surface Topography Guides Confocal Raman Imaging
Siemens’ thermography-based analysis system for frequency converter modules
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WITec GmbH, Ulm, Germany, introduces True Surface Microscopy, an instrument that allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. The core element of this imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. With the new imaging mode, samples that
J Fail. Anal. and Preven. (2011) 11:500–504
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WITec’s alpha500 with attached sensor for profilometry
had previously required extensive preparation to obtain a certain surface flatness can now be automatically characterized as they are. Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment. For more information: WITec Wissenschaftliche, Instrumente und Technologie GmbH, Lise-Meitne
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