Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM)
The breakthrough of scanning tunneling microscopy (STM) [1] in science and technical applications results from its potential in real space imaging of surfaces. As shown by early work [2,3], a lateral resolution can be achieved down to the nanometre or eve
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MATERIALS SCIENCE
Springer-Verlag Berlin Heidelberg GmbH
Physics and Astronomy
ONLINE LIBRARY
http://www.springer.de/phys/
Springer Series in
MATERIALS SCIENCE Editors: R. Hull
R. M. Osgood, Jr.
J. Parisi
The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials.
51 Microscopic and Electronic Structure of Point Defects in Semiconductors and Insulators Determination and Interpretation of Paramagnetic Hyperfine Interactions Editors: T. M. Spaeth and H. Overhof 52 Polymer Films with Embedded Metal Nanoparticles By A. Heilmann 53 Nanocrystalline Ceramics Synthesis and Structure By M. Winterer 54 Electronic Structure and Magnetism of Complex Materials Editors: D.T. Singh and A. Dimitrios
55 Quasicrystals An Introduction to Structure, Physical Properties and Applications Editors: T.-B. Suck, M. Schreiber, and P. Haussler 56 Si0 2 in Si Microdevices ByM.Itsumi 57 Radiation Effects in Advanced Semiconductor Materials and Devices By C. Claeys and E. Simoen 58 Functional Thin Films and Functional Materials New Concepts and Technologies Editor: D. Shi
Series homepage - http://www.springer.de/physlbooks/ssms/ Volumes 1-50 are listed at the end of the book.
F. Ernst M. Ruhle (Eds.)
High-Resolution Imaging and Spectrometry of Materials With 211 Figures Including 32 Color Figures
,
Springer
Dr. Frank Ernst Department of Materials Science and Engineering Case Western Reserve University 414 White Building 10900 Euclid Avenue, Cleveland, OH 44106-7204, USA
Professor Manfred Riihle MPI fUr Materialforschung Heisenbergstrasse 3, 70569 Stuttgart, Germany
Series Editors: Professor R. M. Osgood, Jr. Microelectronics Science Laboratory, Department of Electrical Engineering Columbia University, Seeley W. Mudd Building, New York, NY 10027, USA
Professor Robert Hull University of Virginia, Dept. of Materials Science and Engineering, Thornton Hall Charlottesville, VA 22903-2442, USA
Professor Jiirgen Parisi Universitiit Oldenburg, Fachbereich Physik, Abt. Energie- und Halbleiterforschung Carl-von-Ossietzky-Strasse 9-11, 26129 Oldenburg, Germany ISSN 0933-033X ISBN 978-3-642-0']525-4 Library of Congress Cataloging-in-Publication Data: High-resolution imaging and spectrometry of materialsl F. Ernst and M. RUhle (eds.). p. cm. - (Springer series in materials science, ISSN 0933-0331(; 50) Includes bibliographical references and index. ISBN 978-3-642-07525-4 ISBN 978-3-662-07766-5 (eBook) DOI 10.1007/978-3-662-07766-5 1. Materials-Microscopy. 2. Transmission electron microscopy. I. Riihle, Manfred. II. Ernst, F. (Frank), 1938- III. Springer series in materials science; v. 50. TA417.23.H534 2002 620.1'1299-dc21 2002030612 This work is subject to copyright. All
