Upcoming Conferences
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10/31/2006
3:29 PM
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UPCOMING CONFERENCES
Final Call for Papers Issued for 15th International Conference on Microscopy of Semiconducting Materials http://conferences.iop.org/MSMXV The 15th International Conference on Microscopy of Semiconducting Materials will be held at the University of Cambridge April 2–5, 2007. The conference will focus on the latest developments in the study of the structural and electrical properties of semiconductors by the application of transmission and scanning electron microscopy, scanning probe microscopy, and x-ray-based methods. The abstract deadline is December 6, 2006. Conference sessions will concentrate on key topics including state-of-the-art studies in high-resolution imaging and analytical electron microscopy; advanced scanning probe microscopy, scanning electron microscopy, and focused ionbeam applications; novel epitaxial layer phenomena; the properties of quantum nanostructures; III–nitride developments;
GeSi/Si for advanced devices; metal– semiconductor contacts; and silicides and the important effects of critical device processing treatments. Invited speakers include C. Colliex (Univ. Paris-Sud), “Advanced Nanoscale Analysis of Semiconducting Materials”; J. Gierak (LPN, Marcoussis), “Nano-FIB: From Research to Applications”; C.J. Humphreys (Univ. of Cambridge), “The Puzzle of Exciton Localization in GaN-Based Structures”; S. Iijima (Meijo Univ.), “Carbon Nanotubes from Science to Technology”; T. Jones (Imperial College London), “STM Studies of III–V Nanostructures”; A. Khan (South Carolina Univ.), “Advanced GaN Devices”; J. Mardinly (Intel, Santa Clara), “Moore’s Law and Its Impact on Microscopy”; F. Priolo (Catania Univ.), “Light Emission
from Si Nanostructures”; O.G. Schmidt (MPI, Stuttgart), “Microscopy of Radial Superlattices”; K. Tillmann (Ernst Ruska Center, Jülich), “Progress in AberrationCorrected TEM”; and R. Tromp (IBM, Yorktown Heights), “Semiconductor Nanowires.” The conference proceedings will be published, and contributed papers are requested in all above areas. The conference chairs are Tony Cullis (Sheffield Univ.) and Paul Midgley (Univ. of Cambridge). The conference is endorsed by the Materials Research Society. Further details and information on abstract submission and registration can be accessed from Web site http://conferences.iop. org/MSMXV or by e-mail to claire. [email protected].
Symposium on Nanoporous Materials Publicizes Call for Papers www.electrochem.org/meetings New materials with nanoscale porosity are now being created as a result of developments in synthetic chemistry and materials science. These include metalorganic frameworks, aluminum and anodized aluminum oxide, carbon nanotubes, block copolymers, zeolites, and sol-gel-derived materials. These materials have pores ranging in size from a few angstroms to tens of nanometers and exhibit many interesting properties: extremely high surface area, low density, gas storage capacity, selective molecular binding, remarkable high-temperature stability, luminosity, and ferro- or antif
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