Section News
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ymposium organizers W. Fisher (left) and M. Bennett.
Harold Anderson Dept. of Chemical and Nuclear Engineering University of New Mexico Albuquerque, NM 87131 (505) 277-5431 George Samara Sandia National Laboratories P.O. Box 5800, Org. 1130 Albuquerque, NM 87185 (505) 844-6653 Mike Nastasi Los Alamos National Laboratories MST-7, MS K765 Los Alamos, NM 87545 (505) 667-7007 Any company wishing to participate in the exhibit should contact: Vivienne Harwood Mattox NM Section of MRS, Exhibit Coordinator 440 Live Oak Loop Albuquerque, NM 87122
North Texas Section Cosponsors Sixth Annual Symposium on Electronic Materials, Processing and Characterization The Sixth Annual Symposium on Electronic Materials, Processing and Characterization was held at the Marriott Park Central Hotel in Dallas, Texas on June 1 and 2, 1987. For the second straight year, this conference had as cosponsors the local sections of three national societies: the North Texas Materials Characterization Society of the Materials Research Society, the Texas Chapter of the American Vacuum Society,
and the North Texas Section of The Electrochemical Society. The efforts of the organizing committee, composed of Marylyn Bennett (MRS), Wayne Fisher (AVS), and Allen Bowling (ECS), paid off, as this was the largest and most successful meeting to date. A total of 144 persons registered for the meeting, of whom 31 were students and 30 were equipment vendors. Seven invited talks were given by individuals from the United States and Europe. Of the 19 contributed presentations, 5 papers were given by students competing for two student awards. This marked the first year of the student awards, which were made possible through the generosity of the vendors. The first place award was won by D.L. Leslie-Pelecky of North Texas State University for the paper "A Novel Characterization Method Using Hall Coefficients and Magnetoresistance Measurements." The second place award was won by S.K. Jindal of the University of Texas for the paper "Investigation of Lattice Damage in GaAs Caused by Low Energy Ar Ion Bombardment, by Electron Channeling Patterns." The scheduled sessions highlighted recent work on advanced processing and manufacturing, advanced lithography, dielectrics, epitaxy and deposition, compound semiconductors, metallization, and characterization. Thirty vendors had exhibits for meeting participants to visit during the breaks and during a reception the first evening of the conference. The evening of June 1, the North Texas Materials Characterization Society sponsored a tutorial on sample preparation for cross sectional examination by transmisContinued
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SECTION NEWS sion electron microscopy. The speaker for this tutorial was Richard Flutie of Digital Equipment Corporation. J.M. PHILLIPS
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