Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of compl
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Hiroyuki Fujiwara Robert W. Collins Editors
Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials
Springer Series in Optical Sciences Volume 214
Founded by H. K. V. Lotsch Editor-in-chief William T. Rhodes, Florida Atlantic University, Boca Raton, FL, USA Series editors Ali Adibi, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA Toshimitsu Asakura, Hokkai-Gakuen University, Sapporo, Hokkaido, Japan Theodor W. Hänsch, Max-Planck-Institut für Quantenoptik, Garching, Bayern, Germany Ferenc Krausz, Garching, Bayern, Germany Barry R. Masters, Cambridge, MA, USA Katsumi Midorikawa, Laser Technology Laboratory, RIKEN Advanced Science Institute, Saitama, Japan Bo A. J. Monemar, Department of Physics and Measurement Technology, Linköping University, Linköping, Sweden Herbert Venghaus, Ostseebad Binz, Germany Horst Weber, Berlin, Germany Harald Weinfurter, München, Germany
Springer Series in Optical Sciences is led by Editor-in-Chief William T. Rhodes, Georgia Institute of Technology, USA, and provides an expanding selection of research monographs in all major areas of optics: – – – – – – – –
lasers and quantum optics ultrafast phenomena optical spectroscopy techniques optoelectronics information optics applied laser technology industrial applications and other topics of contemporary interest.
With this broad coverage of topics the series is useful to research scientists and engineers who need up-to-date reference books.
More information about this series at http://www.springer.com/series/624
Hiroyuki Fujiwara Robert W. Collins •
Editors
Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials
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Editors Hiroyuki Fujiwara Department of Electrical, Electronic and Computer Engineering Gifu University Gifu, Japan
Robert W. Collins Department of Physics and Astronomy The University of Toledo Toledo, OH, USA
ISSN 0342-4111 ISSN 1556-1534 (electronic) Springer Series in Optical Sciences ISBN 978-3-319-95137-9 ISBN 978-3-319-95138-6 (eBook) https://doi.org/10.1007/978-3-319-95138-6 Library of Congress Control Number: 2018931482 © Springer International Publishing AG, part of Springer Nature 2018 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the edi
