1990 Spring Meeting Call for Papers
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SURFACE AND NEAR SURFACE STRUCTURE OF POLYMER INTERFACES Jeffry A. Kelber, Sandia National Laboratories, (505) 844-5436: Ralph G. Nuzzo, AT&T Bell Laboratories, (201) 582-5486; Matlhew V. Tirrell, University of Minnesota. (612) 625-0192. FAX (612) 626-7246; Ernesto Occhiello. Istituto Guido Donegani. Italy
MATERIALS ISSUES IN ART AND ARCHAEOLOGY II James R. Druzik. Gerty Conservation Institute. (213) 822-2299; FAX (213) 821-9409; Famela B. Vandiver, Smithsonian Institution. (301) 238-3734; FAX (301) 2383667, George Wheeler, Metropolitan Muséum of Art, (212) 570-3858, FAX (212) 570-3879
ATOMIC SCALE CALCULATIONS OF STRUCTURE IN MATERIALS Michael A. Schluter, AT&T Bell Laboratories. (201) 582-3106; Murray S. Daw, Sandia National Laboratories, (415) 294-2198
Aprll16-21,1990 San Francisco, Califomia San Francisco Marriott Hôtel
IMIR
CALL FOR PAPE
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MATERIALS RESEARCH SOCIETY
Abstract Deadline: November 15,1989 BETTER CERAMICS THROUGH CHEMISTRYIV C.J. Brinker. Sandia National Laboratories. (505) 846- 3552. FAX (505) 846-5064: D.E. Clark. University of Florida. (904) 392-7660. FAX (904) 392-6359; Donald R. Ulrich, Air Force Office of Scientific Research, (202) 767-4963: Brian J.J. Zelinski. Arizona Materials Laboratories. (602) 322-2977. FAX (602) 322-2993 ADVANCED METALLIZATIONS IN MICROELECTRONICS Avishay Katz. AT&T Bell Laboratories. (201) 582-2261. FAX (201) 582-5917; Shyam P. Murarka, Rensselaer Polytechnic Institute. (518) 276-2978. FAX (518) 2768761; Ami Appelbaum. Rockwell International Corporation. (214) 996-6522. FAX (214) 996- 5545 POLYSILICON THIN FILMS AND INTERFACES Bruha Raicu, Integrated Technology Associate, (408) 773-8614; FAX (415) 941-2704; T. Kamins. Hewlett-Fackard. (415) 857-5470. FAX (415) 8575308; Cari V. Thompson. Massachusetts Institute of Technology. (617) 253-7652. FAX (617) 258-8539 CRITICAL CURRENTS IN HIGH-TEMPERATURE SUPERCONDUCTORS John R. Clem. lowa State University, (515) 294-4223, FAX (515) 294-0689; Jack W. Ekin, National Institute of Standards & Technology, (303) 497-5448, FAX (303) 497-5316; Sungho Jin, AT&T Bell Laboratories, (201) 582-4076, FAX (201) 582-2913; Donald M. Kroeger, Oak Ridge National Laboratory, (615) 5745155, FAX (615) 574-6073 HIGH RESOLUTION ELECTRON MICROSCOPY OF DEFECTS IN MATERIALS Robert Sinclair, Stanford University, (415) 723-1102, FAX (415) 725-4034; Ulrich Dahmen. University of California, Berkeley, (415) 486-4627, FAX (415) 4864888; David J. Smith. Arizona State University. (602) 965-4540
MATERIALS FOR SENSORS AND SEPARATIONS Marc Anderson, University of Wisconsin-Madison, (608) 2622470, FAX (608) 262-0454; John Armor, Air Products a n d Chemicals, Inc., (215) 481-5792. FAX (215) 481-4600; D. Jed Harrison. University of Alberto, (403) 4922790, FAX (403) 492-8231; Antonio J. Ricco, Sandia National Laboratories, (505) 846-4947, FAX (505) 846-2009 ALLOY PHASE STABILITY AND DESIGN G. Malcolm Stocks, Oak Ridge National Laboratory, (615) 5745163; Anthony F. Giamei, United Technologies Research Center, David R Pope. University of Pennsylvania, (215) 89
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