Call for Papers: 1994 MRS Spring Meeting
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MATERIALS RESEARCH SOCIETY
April 4-8, 1994 San Francisco Marriott Hotel San Francisco, California
Abstract Deadline: November 1, 1993
SYMPOSIA A: AMORPHOUS SILICON TECHNOLOGY -1994 Eric A. Schiff, Syracuse University, (315) 443-3908, Fax (315) 443-9103, [email protected]; Michael Hack, Xerox Palo Alto Research Center, (415) 812-4535, Fax (415) 493-6349, [email protected]; Arun Madan, MV Systems, Inc., (303) 526-9016, Fax (303) 526-1408; Martin J. Powell, Philips Research Laboratories, United Kingdom, (44) 293-815153, Fax (44) 293-815500, [email protected]; Akihisa Matsuda, Electrotechnical Laboratory, Japan, (81) 298-54-5252, Fax (81) 298-58-5425; Administrative Contact: Mary Ann Woolf, University of Utah, (801) 581-4246, Fax (801) 581-4246 or 4801, [email protected] B: ADVANCED METALLIZATION FOR DEVICES AND CIRCUITS - SCIENCE, TECHNOLOGY, AND MANUFACTURABILITY - m Shyam P. Murarka, Rensselaer Polytechnic Institute, (518) 2762978, Fax (518) 276-8761; Avishay Katz, AT&T Bell Laboratories, (908) 582-2261, Fax (908) 582-4347; K.N. Tu, IBM T.J. Watson Research Center, (914) 945-1602, Fax (914) 945-2141; Karen Maex, IMEC, Belgium, (32) 16-28-1211, Fax (32) 16-281214 C: MATERIALS RELIABILITY IN MICROELECTRONICS IV Peter E. B(|>rgesen, Cornell University, (607) 255-7218, Fax (607)255-6575, [email protected]; JohnE. Sanchez, Jr., Advanced Micro Devices, (408) 749-2169, Fax (408) 7495144, [email protected]; William Filter, Sandia National Laboratories, (505) 844-3971, Fax (505) 844-2991; Kenneth P. Rodbell, IBM T.J. Watson Research Center, (914) 945-1012, Fax (914) 945-2141, [email protected]; John C. Coburn, E.I. DuPont Experimental Station, (302) 6953413, Fax (302) 695-3813, [email protected]
F: EPITAXIAL OXIDE THTN FILMS AND HETEROSTRUCTURES R. Ramesh, Bellcore, (908) 758-3126, Fax (908) 758-4372, [email protected]; Julia M. Phillips, AT&T Bell Laboratories, (908) 582-4428, Fax (908) 582-2521, [email protected]; D.K. Fork, Xerox PARC, (415) 812-4121, Fax (415) 812-4140, [email protected]; R.M. Wolf, Philips Research Laboratories, The Netherlands, (31) 40-743748, Fax (31) 40-743365, [email protected] . G: RAPID THERMAL AND INTEGRATED PROCESSING HI Jeffrey C. Gelpey, Peak Systems, Inc., (508) 535-6997, Fax (508) 535-7079; Martin L. Green, AT&T Bell Laboratories, (908) 582-5310, Fax (908) 582-2699, [email protected]; Jimmie J. Wortman, North Carolina State University, (919) 515-5255, Fax (919) 515-3027, [email protected]; Steven R.J. Brueck, University of New Mexico, (505) 277-6033, Fax (505) 277-6433, [email protected] H: POLYCRYSTALLJJVE THIN FILMS - STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS Michael Parker, IBM ADSTAR, (408) 256-4039, Fax (408) 256-5151, [email protected]; Robert Sinclair, Stanford University, (415) 723-1102, Fax (415) 725-4034; Jerrold Floro, Sandia National Laboratories, (505) 844-4708, Fax (505) 844-9185; Katayun (Katy) Barmak, Lehigh University, (215) 758-4218, Fax (215) 758-4244, [email protected]; Davi
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