Applied Scanning Probe Methods XII Characterization
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will
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NanoScience and Technology Series Editors: P. Avouris B. Bhushan D. Bimberg K. von Klitzing H. Sakaki R. Wiesendanger The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technologyoriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the field. These books will appeal to researchers, engineers, and advanced students. Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics Editors: M. Nosonovsky, B. Bhushan
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs
Applied Scanning Probe Methods I Editors: B. Bhushan, H. Fuchs, S. Hosaka
Applied Scanning Probe Methods XII Characterization Editors: B. Bhushan, H. Fuchs
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods III Characterization Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods IV Industrial Application Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, S. Kawata Applied Scanning Probe Methods VI Characterization Editors: B. Bhushan, S. Kawata Applied Scanning Probe Methods VII Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods IX Characterization Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods X Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs, M. Tomitori
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs Magnetic Microscopy of Nanostructures Editors: H. Hopster and H.P. Oepen The Physics of Nanotubes Fundamentals of Theory, Optics and Transport Devices Editors: S.V. Rotkin and S. Subramoney Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces By G. Kaupp Nanocatalysis Editors: U. Heiz, U. Landman Roadmap of Scanning Probe Microscopy Editors: S. Morita Nanostructures – Fabrication and Analysis Editor: H. Nejo
Bharat Bhushan Harald Fuchs
Applied Scanning Probe Methods XII Characterization
With 101 Figures and 14 Tables Including 70 Color Figures
Editors Prof. Dr. Bharat Bhushan Ohio State University Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2 ) 201 W. 19th Ave Columbus, Ohio 43210-1142 USA [email protected] Series Editors Professor Dr. Phaedon Avouris IBM Research Division Nanometer Scale Science & Technology Thomas J.Watson Research Center, P.O. Box 218 Yorktown Heights, NY 10598, USA Professor Bharat Bhu
