X-Ray Optics
Due to the weak interaction of hard X rays with matter it is generally difficult to manipulate X rays by optical components. As a result, there have been many complementary approaches to making X-ray optics, exploiting refraction, reflection, and diffract
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X-Ray Optics 18. X-Ray Optics
Due to the weak interaction of hard X rays with matter it is generally difficult to manipulate X rays by optical components. As a result, there have been many complementary approaches to making X-ray optics, exploiting refraction, reflection, and diffraction of X-rays by matter. In this chapter, we describe the physics that underly X-ray optics and explain the work principles and performances of a variety of X-ray optics, including refractive X-ray lenses, reflective optics, such as mirrors and wave-
18.2 X-Ray Optical Components..................... 1156 18.2.1 Refractive Optics .......................... 1156 18.2.2 Reflective Optics........................... 1158 18.2.3 Diffractive Optics .......................... 1159 References .................................................. 1162 guides, and diffractive optics, such as multilayer and crystal optics and Fresnel zone plates.
ing number of applications, requiring both imaging and focusing optics. The most important X-ray optics are reviewed in this chapter (Sect. 18.2). For imaging, i. e., in full-field microscopy, Fresnel zone plates and refractive X-ray lenses are most commonly used. They are used as objective lens, generating a magnified image of the specimen on the detector. In this way, spatial resolutions in the range of 100 nm and below can be achieved. The key strength of this type of microscopy is the large penetration depth of hard X-rays in matter, which allows one to image the interior of an object without destructive sample preparation. By combining this technique with tomography, the three-dimensional inner structure of an object can be reconstructed at high spatial resolution. Scanning microscopy, on the other hand, allows one to perform with high spatial resolution hard X-ray analytical techniques, such as diffraction, fluorescence analysis, or absorption spectroscopy, that yield the local (nano-)structure, the elemental composition, or the chemical state of an element in the sample, respectively. When combined with tomography, spectroscopic information from inside a specimen can be obtained. The small beam for these scanning techniques is often generated by means of an X-ray optic, such as zone plates, refractive lenses, or curved total reflection or multilayer mirrors. Currently, all these optical schemes are capable of generating intensive beams with a lateral extension well below 100 nm at third-generation synchrotron radiation sources. In addition to scanning microscopy applications, the small beam can also be used as a small source for magnified projection mi-
Part D 18
In the last 10 years outstanding progress has been made in X-ray optics. This development has been triggered by the availability of high-brilliance synchrotron radiation sources. Well-known optical schemes have been improved and new ones have been invented. Important fields of application for these optics are collimation and focusing, both at laboratory and synchrotron radiation sources, and hard X-ray microscopy, which is a growing fie
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