Applied Scanning Probe Methods X Biomimetics and Industrial Applicat
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of s
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NanoScience and Technology Series Editors: P. Avouris B. Bhushan D. Bimberg K. von Klitzing H. Sakaki R. Wiesendanger The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technologyoriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the field. These books will appeal to researchers, engineers, and advanced students. Magnetic Microscopy of Nanostructures Editors: H. Hopster and H.P. Oepen Applied Scanning Probe Methods I Editors: B. Bhushan, H. Fuchs, S. Hosaka The Physics of Nanotubes Fundamentals of Theory, Optics and Transport Devices Editors: S.V. Rotkin and S. Subramoney Single Molecule Chemistry and Physics An Introduction By C. Wang, C. Bai Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces By G. Kaupp Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods III Characterization Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods IV Industrial Application Editors: B. Bhushan, H. Fuchs
Nanocatalysis Editors: U. Heiz, U. Landman Roadmap of Scanning Probe Microscopy Editors: S. Morita Nanostructures – Fabrication and Analysis Editor: H. Nejo Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, S. Kawata Applied Scanning Probe Methods VI Characterization Editors: B. Bhushan, S. Kawata Applied Scanning Probe Methods VII Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods IX Characterization Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods X Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs, M. Tomitori
Bharat Bhushan Harald Fuchs Masahiko Tomitori
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
With 306 Figures and 9 Tables Including 81 Color Figures
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Editors: Professor Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. 19th Avenue The Ohio State University, Columbus Ohio 43210-1142, USA e-mail: [email protected]
Professor Dr. Harald Fuchs Institute of Physics, FB 16 University of Münster Wilhelm-Klemm-Str. 10 48149 Münster, Germany e-mail: [email protected] Professor Dr. Masahiko Tomitori Advanced Institute of Science & Technology School of Materials Science Asahidai, Nomi 1-1 923-1292 Ishikawa, Japan e-mail: [email protected]
Series Editors: Professor Dr. Phaedon Avouris IBM Research Division Nanometer Scale Science & Technology Thomas J. Watson Research Center, P.O. Box
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